Boost your cross-section analysis

Reap the benefits for electronics QC and R&D

Are you looking to improve the efficiency and reliability of your approach to quality control, failure analysis, and R&D for electronics manufacturing? Our new Science Lab article delves deep into cross-section preparation and analysis.

We explore the critical role that cross-section analysis can play for quality control of the internal structure of printed circuit boards (PCBs) and assemblies (PCBAs), integrated-circuit (IC) chips, and battery components in terms of understanding defects and failures.

Our comprehensive article will help you learn more about fast and reliable cross-section preparation and advanced analysis techniques. It covers the entire range, from sawing, milling, grinding, and polishing for preparation to microscopy and spectroscopy for analysis.

Learn more now from the article on Science Lab, our popular free-to-access knowledge portal here

Sincerely,
Your Leica Microsystems team

For any questions, please contact:

Mikael Ankler
Country Manager

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mikael.ankler@micromedic.se